Event Details
- November 27 - 30, 2024
- [email protected]
- Osaka,
- http://jiam-show.com/en
Organized By
- JASMA (Japan Sewing Machinery Manufacturers Association)
- [email protected]
- Paper Communication Exhibition Service
- [email protected]
Join us at JIAM 2024, the Japan International Apparel Machinery Trade Show, held from November 27 to 30, in Osaka. Discover the latest advancements in clothing machines and fabrics within the apparel industry. Don't miss this biennial event organized by JASMA and Paper Communication Exhibition Service. Description: Welcome to JIAM - Japan International Apparel Machinery Trade Show 2024! This highly anticipated trade exhibition will take place in the vibrant city of Osaka from November 27 to 30. JIAM is a biennial event organized by the Japan Sewing Machinery Manufacturers Association (JASMA) and Paper Communication Exhibition Service, dedicated to showcasing the most innovative apparel machinery and fabrics with a focus on the clothing textiles industry. Throughout the four days of the event, attendees will have the opportunity to explore a wide range of cutting-edge machinery, technologies, and textiles that are revolutionizing the apparel manufacturing sector. Trade professionals from all over the world will gather to network, learn, and engage in business opportunities with leading industry experts and suppliers. JIAM 2024 is the ideal platform for industry enthusiasts, entrepreneurs, and major players to stay up to date with the newest trends and developments in clothing machines and textile fabrications. From advancements in automation and digital technologies to sustainable and eco-friendly solutions, the exhibition will cover all aspects of the apparel machinery sector. The event will be held at the renowned Intex Osaka, a world-class venue known for hosting prestigious trade shows and exhibitions. Join us at JIAM 2024 and be a part of the future of the apparel machinery industry. Mark your calendars now and secure your spot at this highly anticipated international event.